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Scanning Probe Microscopy
3D Optical Profilometer
LEED/AES Spectrometer
Nanofiber production
Tribology - Nanoindentation
XRF / Layer Thickness
Nanoparticles
Magnet - Vacuum - Measuring instruments

NEW: KLA-Tencor Stylus-Profiler

Scanning Probe Microscopy 

- RHK

- AFM Workshop (TT-AFM)

- AFM Cantilever (AppNano)

- MikroMasch

- nanoAnalytics QFM-Module

- TableStable
- Accessories
- SPIP 

3D Optical Profilometer 

- gbs

- KLA-Tencor (Stylus + Optical)

- Mountains Software

 

 

Stylus-Profiler 

- KLA-Tencor (Stylus + Optical)

 

 

LEED/AES Spectrometer 

- OCI

 

 

 

 

 

Nanofiber production 

- ELMARCO

 

 

 

 

 

Tribology - Nanoindentation 

- CETR 

- Alemnis (in-situ indenter)

 

 

XRF / Layer Thickness Measurements

- Roenalytic Layer Thickness

- Roenalytic Material Analysis
- Sigma QCM

 

 

 

 

 

Nanoparticles

- Matter
- Californiameasurements 

 

Magnet - Vacuum - Measuring instruments

- Hastings
- Sigma

- Metrolab

- Picowatt

- VACSEAL
Contact
Schaefer Technologie GmbH
Robert-Bosch-Str. 31
63225 Langen, Deutschland
Telefon +49-6103-300 98 0
Telefax +49-6103-300 98 29
info@schaefer-tec.com
www.schaefer-tec.com