In-Situ Thin Film Measurement & Control with QCM sensors

The QCM technology is the most commonly used method to monitor and control rate and thickness in In-Situ deposition processes. Our broad line of QCM instrumentation is including deposition monitors, controllers, crucible indexer, software and vacuum accesories such as sensors and feedthroughs.
The powerful and easy-to-use instruments allow for reliable and accurate rate/thickness measurement and control in single and multi layer thin film processes, simultaneous deposition Co-Deposition of multiple matrials, data logging and graphing.

Products:

-Q-pod Single Channel Quartz Crystal Monitor
-SQM 160 Multi-Channel Quartz Crystal Monitor
-SQM 242 Co-Deposition Controller on PCI-Card
-SQC 300 Series Multi-Layer Co-Deposition Controllers
-EIES Gurdian IV
-CI 100 Crucible Indexer
-QCM Sensors, Feedthoughs and Accessories
-EIES Gurdian IV

Applications:

-Physical Vapor Deposition Processes 

- Vacuum coating instruments