Scanning Probe Microscopy

- RHK
- Nanosurf

- AFM Cantilever
- MikroMasch

- nanoAnalytics QFM-Module
- TableStable
- Accessories
- SPIP

3D Optical Profilometer

- gbs
- PhaseView
- AEP
- Mountains Software

LEED/AES Spectrometer

- OCI

XPS

- Kratos

Nanofiber production

- ELMARCO

Tribology - Nanoindentation

- CETR

XRF / Layer Thickness Measurements

- Roenalytic Layer Thickness

- Roenalytic Material Analysis
- Sigma QCM

Particle measurement

- NanoSight

- Ambivalue (micrometer - millimeter)

- Matter (aerosol)
- Californiameasurements (impactor)

Magnet - Vacuum - Measuring instruments

- Hastings
- Group 3
- Sigma

Contact
Schaefer Techniques Sarl
1, Rue du Ruisseau Blanc
91620 Nozay, Frankreich
Telefon + 33 - 1 - 64496350
Telefax + 33 - 1 - 69011205
info@schaefer-tech.com
www.schaefer-tech.com