NEW: Affordable multi-mode AFM with OPEN DESIGN

TT-AFM with contact mode, dynamic mode, phasemode and lateral force mode as well as open LabView software and integrated video camera for a price below 25'000.- Euro!

Scanning Probe Microscopy

- Park Systems
- RHK
- AFM Workshop (TT-AFM)

- AFM Cantilever
- MikroMasch

- nanoAnalytics QFM-Module
- TableStable
- Accessories
- SPIP

3D Optical Profilometer

- Sensofar
- gbs
- Lyncee-Tec
- PhaseView
- AEP
- Mountains Software

X-Ray Tomography

- XRT

LEED/AES Spectrometer

- OCI

Nanofiber production

- ELMARCO

Tribology - Nanoindentation

- CETR

XRF / Layer Thickness Measurements

- Roenalytic Layer Thickness

- Roenalytic Material Analysis
- Sigma QCM

Particle measurement

- NanoSight

- Ambivalue (micrometer - millimeter)

- Matter (aerosol)
- Californiameasurements (impactor)

Magnet - Vacuum - Measuring instruments

- Hastings
- Group 3
- Sigma

- Metrolab

- Picowatt

- VACSEAL

Contact
Schaefer Technologie GmbH
Robert-Bosch-Str. 31
63225 Langen, Deutschland
Telefon +49-6103-300 98 0
Telefax +49-6103-300 98 29
info@schaefer-tec.com
www.schaefer-tec.com