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Park Webinar: Graphene Moiré Pattern Ultra-High Resolution Atomic Force Microscopy, 26.01.207, Webinar 7:00 pm – 8:00 pm (CET)

Single Cell Manipulation 

- FluidFM ® 

Elektronenmikroskopie 

- Delphi (CLEM)

LEED/AES Spectrometer 

- OCI

 

 

Nanoparticle production 

- NanoAssemblr

 

 

Tribology - Nanoindentation 

- Rtec 

- Alemnis (in-situ indenter)

 

 

XRF / Layer Thickness Measurements

- Inficon QCM

 

 

 

 

 

Magnet - Vacuum - Measuring instruments

- Hastings
- Group 3
- Sigma

- Metrolab

- Picowatt

- VACSEAL

Contact
Schaefer Technologie GmbH
Robert-Bosch-Str. 31
63225 Langen, Deutschland
Telefon +49-6103-300 98 0
Telefax +49-6103-300 98 29
info@schaefer-tec.com
www.schaefer-tec.com