RHK Technology has been a world leading supplier of surface analysis instrumentation for over 20 years.

- UHV VT AFM/STM

- UHV LT QuadraProbe(TM)

- AFM/STM/SEM

- Universal SPM controls

The following list is a legend to the images on the right side: 

▪ UHV VT AFM/STM  (Image A)

Vacuum STM or AFM/STM, ambient temperature or variable temperature; UHV- systems including sample preparation and additional analysis methods; Options for variable magnetic field and for optical access

▪ UHV AFM/STM/ SEM (Image B and C)

Navigation of the SPM-tip under obervation by a Scanning Electron Microscope

▪ UHV LT QuadraProbe™ (Image D and E)

Up to 4 independent atomic resolution measuring tips, sample and tip chilled at 10 K, SEM for tip navigation

▪ Pan-Style LT STM / TF-AFM-Kit (Image F)

Scan head for low temperature use down to 300 mK; STM or optional tuning fork AFM; integral x/y-offsets

▪ ATM 300/350 (Image G)

STM or AFM/STM for use at ambient conditions, for small scan ranges and highest resolution, prepared for upgrade to UHV

▪ Universal SPM Control Systems (Image H and I) 

Electronics and software for different brands or homebuilt scan heads; newest model R9 offers IHDL™ with „drag and drop“- composition of the desired hardware configuration

▪ PLLPro Control System for NC-AFM (Image J)

Fully digital electronics and software to support all AFM modes; Newest version PLLPro 2 ™ includes Kelvin Probe Microscopy

▪ Upgrades of existing systems

The modular concept allows easy and economical paths to extended RHK systems:

From STM to AFM/STM, from RT to VT, from external to internal vibration damping, from manual PPC100 to digital PPC200, from older control system hardware and software to SPM 1000 rev. 8.5 with XPMPro 2.0

Applications

UHV STM and AFM at room temperature or variable temperature down to 10K (sample and tip) respectively up to 1500K. Variable magnetic field. Optical access.