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Roentgenanalytic Material Analysis

EAGLE III
NanoMaster (vacuum chamber)
Measurement of film thickness on PCB
XRF Spectrum

Elemental Analysis by X-ray Fluorescence

 

Innovative micro-XRF-systems for the nondestructive material analysis, coating thickness measurement as well as RoHS/WEEE analysis.

The instruments are produced by Roenalytic in Germany combine a broad spektrum of elements with a high lateraler resolution (beam diameter down to 20 micrometer due to capillary X-ray optics) as well as low limits of detection. The integrated vacuum chamber allows measurements of light elements or under controlled gas atmosphere.  

 

 

Instruments:

NanoMaster

EAGLE III µ-Probe

 

 

Application note:

- Forensic Applications

 

 

Applications

- Quantitative material analysis

- Precious metal analysis

- X-ray analyzer

- Micro analysis

- Micro X-ray analysis 

- Gold assay

- Precious metal analysis

- Printed cirquit board (PCB) analysis

- Forensics

- NDT

- RoHS

- WEEE

 

 

 

 

 

 

 

 

 

 

 

 

 

Contact
Schaefer Technologie GmbH
Robert-Bosch-Str. 31
63225 Langen, Deutschland
Telefon +49-6103-300 98 0
Telefax +49-6103-300 98 29
info@schaefer-tec.com
www.schaefer-tec.com

Further Information

Links
- Website Roentgenanalytic


Downloads

 

 

Mail to Schaefer