For content in Italian please visit: www.schaefer-tec.it

Scanning Probe Microscopy

- RHK
- Nanosurf

- AFM Cantilever
- MikroMasch

- nanoAnalytics QFM-Module
- TableStable
- Accessories
- SPIP

3D Optical Profilometer

- Sensofar
- gbs
- Lyncee-Tec
- PhaseView
- AEP
- Mountains Software

X-Ray Tomography

- XRT

LEED/AES Spectrometer

- OCI

Tribology - Nanoindentation

- CETR

XRF / Layer Thickness Measurements

- Roenalytic Layer Thickness

- Roenalytic Material Analysis
- Sigma QCM

Nanoparticles

- NanoSight
- Matter
- Californiameasurements

Magnet - Vacuum - Measuring instruments

- Hastings
- Group 3
- Sigma

- Picowatt

- VACSEAL

Contact

Schaefer South-East Europe Piazza Merlin 11
I-45100 Rovigo
Telefon + 39 - 0425 - 46 02 18
Telefax + 39 - 0425 - 27 22 8
italia@schaefer-tec.com
www.schaefer-tec.it