Desktop scanning electron microscope (SEM)

NEW: Phenom proX (with EDS elemental analysis)

- Excellent image quality thanks to CeB6 filament with high brilliance at low acceleration voltage 

- 1000 hours lifetime of filament guaranteed (2-4 years of typical use)

- Magnification up to 45'000x (plus 12x digital zoom)

- Variable acceleration voltage (with proX)

- EDS elemental analysis (with proX)  

- Fast sample preparation

- Simple and fast sample loading (10-15 seconds)

- Intuitive navigation with "never-lost" functionality

- Motorized precision XY table

- Colour CCD camera with 20-120x zoom (G2 PRO)

- Optional: 3D view, rougness determination, image stitching as well as automatic fiber diameter measurements

A range of new sample holders and inserts are available:

- Charge Reduction sample holder: for nonconductive samples which can be imaged without coating 

- Micro-electronics insert: non-destructive sample preparation for wafer based samples

- X-view insert: X-sectional preparation of fractured surfaces

- Micro Tool sample holder: for micro tools like drills, end mills, routers, boring bars, engraving tools etc.

- Temperature controlled sample holder (-25°C to +50°C)

- Motorized rotation and tilt sample holder

Application

- Pharmaceutical industry

- Powder

- Metallurgical analysis

- Process control

- Quality control

- Research labs 

- Fibermetric system for fiber analysis

- Benchtop electron microscope, tabletop electron microscope, portable electron microscope

- EDX, EDS

- MEB de table, microscope électronique de table