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Scanning Probe Microscopy
3D Optical Profilometer
X-Ray Tomography
Electron Microscopy
LEED/AES Spectrometer
Nanofiber production
Tribology - Nanoindentation
XRF / Layer Thickness Measurements
Particle measurement
Magnet - Vacuum - Measuring instruments

NEW: Affordable multi-mode AFM with OPEN DESIGN

TT-AFM with contact mode, dynamic mode, phasemode and lateral force as well as open LabView software and integrated video camera for a price below 25'000.- Euro!

Scanning Probe Microscopy 

- Park Systems
- RHK

- AFM Workshop (TT-AFM)

- AFM Cantilever
- MikroMasch

- nanoAnalytics QFM-Module
- TableStable
- Accessories
- SPIP 

3D Optical Profilometer 

- Sensofar
- gbs
- PhaseView
- AEP
- Mountains Software

 

 

X-Ray Tomography 

- XRT

 

 

 

 

 

 

Electron Microscopy 

- Phenom
- MeX 

LEED/AES Spectrometer 

- OCI

 

Nanofiber production 

- ELMARCO

 

Tribology - Nanoindentation 

- CETR 

 

XRF / Layer Thickness Measurements

- Roentgenanalytic Layer Thickness

- Roentgenanalytic Material Analysis
- Sigma QCM

 

 

Particle measurement

- NanoSight

- Ambivalue (micrometer - millimeter)

- Matter (aerosol)
- Californiameasurements (impactor) 

 

Magnet - Vacuum - Measuring instruments

- Hastings
- Group 3
- Sigma

- KERN balances and weights 

- GE-5 Digitalmikroskop

- Picowatt

- VACSEAL

- SAUTER measuring technology
Contact
Schaefer-Tec AG
Badimatte 21
Postfach 431
3422 Kirchberg, Schweiz
Telefon + 41 - 34 - 423 70 70
Telefax + 41 - 34 - 423 70 75
ch@schaefer-tec.com
www.schaefer-tec.com