NEW: Affordable multi-mode AFM with OPEN DESIGN

TT-AFM with contact mode, dynamic mode, phasemode and lateral force as well as open LabView software and integrated video camera for a price below 25'000.- Euro!

Scanning Probe Microscopy

- RHK
- AFM Workshop (TT-AFM)

- AFM Cantilever
- MikroMasch

- nanoAnalytics QFM-Module
- TableStable
- Accessories
- SPIP

3D Optical Profilometer

- gbs
- PhaseView
- AEP
- Mountains Software

X-Ray Tomography

- XRT

LEED/AES Spectrometer

- OCI

Tribology - Nanoindentation

- CETR

XRF / Layer Thickness Measurements

- Roenalytic Layer Thickness

- Roenalytic Material Analysis
- Sigma QCM

Nanoparticles

- NanoSight
- Matter
- Californiameasurements

Magnet - Vakuum - Measuring instruments

Contact
Schaefer Techniques Sarl
1, Rue du Ruisseau Blanc
91620 Nozay, Frankreich
Telefon + 33 - 1 - 64496350
Telefax + 33 - 1 - 69011205
info@schaefer-tech.com
www.schaefer-tech.com