- Park Systems- RHK
- AFM Workshop (TT-AFM)
- AFM Cantilever (AppNano)- MikroMasch
- nanoAnalytics QFM-Modul- TableStable- Zubehör- SPIP
- Sensofar- gbs
- KLA-Tencor (Stylus + Optisch)
- Mountains Software
- Phenom
- OCI
- ELMARCO
- CETR
- Alemnis (in-situ Indenter)
- Roentgenanalytic Schichtdicke
- Roentgenanalytic Elementanalyse- Sigma QCM
- NanoSight
- Ambivalue (Mikrometer - Millimeter)
- Matter (Aerosol)- Californiameasurements (Impaktor)
- Hastings- Group 3- Sigma
- KERN Waagen und Gewichte
- GE-5 Digitalmikroskop
- Picowatt
- VACSEAL
- SAUTER Messtechnik